Ultrasound Imaging Device VSA M-350

/ Ultrasound Imaging Device VSA M-350
This is an ultrasonic imaging device that uses Scanning Acoustic Tomography (SAT) to analyze Integrated Circuit (IC) failures. It is a compact, stable, and user-friendly machine. It has a standard calibration function that enables it to keep in focus any time reproduction of an image takes place, as well as an auto-calibration feature. It is easy to set parameters. It supports mass inspection with programmable scanning techniques for automatic flaw analysis and center adjustment. The defective IC chips are rejected/sorted by robotic arm. The high-resolution imaging allows flexible layouts for displaying inspection results.
Ultrasound Imaging Device VSA M-350

Ultrasound Imaging Device VSA M-350

This is an ultrasonic imaging device that uses Scanning Acoustic Tomography (SAT) to analyze Integrated Circuit (IC) failures. It is a compact, stable, and user-friendly machine. It has a standard calibration function that enables it to keep in focus any time reproduction of an image takes place, as well as an auto-calibration feature. It is easy to set parameters. It supports mass inspection with programmable scanning techniques for automatic flaw analysis and center adjustment. The defective IC chips are rejected/sorted by robotic arm. The high-resolution imaging allows flexible layouts for displaying inspection results.

Ultrasound Imaging Device VSA M-350
Ultrasound Imaging Device VSA M-350
Selection Parameters
ParametersMinMax
Scan Range (XYZ in mm)350 X 320 X 80
Scan Speed (mm/s)1200
Measurement Pitch(mm)0.001
AC Power Supply100 V/200 V,15 A
Supply Body Size (W X D X H in mm)780 X 900 X 1250
Quantity (Kg)About 350
Safety DevicesEmergency Stop Button, Door Open/Close Detection Sensor
Available Measurement ModeC-Scan, Tray-scan, Through-scan, Index-scan, Grid-Scan, Full waveform scan
Analysis Function1. Defect area measurement 2. Defect location measurement 3. Defect binary display 4. Waveform analysis 5. FFT video processing probe option
Machines / Applications
IC Chip Inspections
Capacitor Inspections
Matrix Tray Scan
Industries
Material Science Industry
Defense Industry
Renewable Energy Industry
Aeospace & Automotive Industry
Electronics Industry
Semiconductor Industry
Enquire Now

Ultrasound Imaging Device VSA M-350

/ Ultrasound Imaging Device VSA M-350
This is an ultrasonic imaging device that uses Scanning Acoustic Tomography (SAT) to analyze Integrated Circuit (IC) failures. It is a compact, stable, and user-friendly machine. It has a standard calibration function that enables it to keep in focus any time reproduction of an image takes place, as well as an auto-calibration feature. It is easy to set parameters. It supports mass inspection with programmable scanning techniques for automatic flaw analysis and center adjustment. The defective IC chips are rejected/sorted by robotic arm. The high-resolution imaging allows flexible layouts for displaying inspection results.
Ultrasound Imaging Device VSA M-350

Ultrasound Imaging Device VSA M-350

This is an ultrasonic imaging device that uses Scanning Acoustic Tomography (SAT) to analyze Integrated Circuit (IC) failures. It is a compact, stable, and user-friendly machine. It has a standard calibration function that enables it to keep in focus any time reproduction of an image takes place, as well as an auto-calibration feature. It is easy to set parameters. It supports mass inspection with programmable scanning techniques for automatic flaw analysis and center adjustment. The defective IC chips are rejected/sorted by robotic arm. The high-resolution imaging allows flexible layouts for displaying inspection results.

Ultrasound Imaging Device VSA M-350
Ultrasound Imaging Device VSA M-350
Selection Parameters
ParametersMinMax
Scan Range (XYZ in mm)350 X 320 X 80
Scan Speed (mm/s)1200
Measurement Pitch(mm)0.001
AC Power Supply100 V/200 V,15 A
Supply Body Size (W X D X H in mm)780 X 900 X 1250
Quantity (Kg)About 350
Safety DevicesEmergency Stop Button, Door Open/Close Detection Sensor
Available Measurement ModeC-Scan, Tray-scan, Through-scan, Index-scan, Grid-Scan, Full waveform scan
Analysis Function1. Defect area measurement 2. Defect location measurement 3. Defect binary display 4. Waveform analysis 5. FFT video processing probe option
Machines / Applications
IC Chip Inspections
Capacitor Inspections
Matrix Tray Scan
Industries
Material Science Industry
Defense Industry
Renewable Energy Industry
Aeospace & Automotive Industry
Electronics Industry
Semiconductor Industry
Enquire Now